MicroNano Tools Atomic Force Microscope MNT-AFM-1000

General Introduction The MNT-AFM-1000 is an atomic force microscope, using a scanning probe for various modes of monochromatic imaging. Resolution of the system can reach as small as 0.03 nm, which far surpasses the limitations of an optical microscopes by approximately 1000X. The scanning process uses three-dimensional movement up to 20μm in lateral direction, and 2.5 μm vertically. The probe can be used for both contact and tapping modes, depending on the nature of the sample. Contact mode provides a force-measurement of the sample surface, resulting in high resolutions, but biased by friction and adhesion. Tapping modes avoid friction and adhesion through intermittent-contact. The MNT-AFM-1000 has been widely applied in the fields of solid state physics, semiconductor science and technology, molecular engineering, polymer chemistry and physics, surface chemistry, molecular biology, cell biology, and medicine, material characterization, optoelectronics, and optical glasses. Along wit