Fully Automatic First Article Inspection System FAI-i177

Enhance your SMT inspections with the fast, accurate, and reliable FAI-i177 system. The system automatically recognizes the customer's BOM and CAD position drawing, generating the test program within 5 minutes without modifying the data. It switches test gears, reads values, compares them with the BOM, and determines PASS or NG. Supports searching for untested devices, NG components, and specific material numbers. For chips, diodes, and silk-screened resistors, it automatically identifies silk-screening, orientation, and polarity. Standard sample storage allows data retrieval for the same substrate type without re-importing. After testing, it generates a report with device images and PCBA information, which can be archived, printed, and emailed.